作者: C.L. Lin , Ching-Hao Hsieh , Tsend-Ayush Tserendagva , J.D. Miller
DOI: 10.1016/J.MINENG.2012.09.001
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摘要: Abstract Procedures are described for the evaluation and isolation of trace mineral particles from sample populations at ppm level by dual energy rapid scan radiography using an X-ray microtomography instrument (XMT). After calibration XMT, samples split into narrow size fractions, each fraction distributed/assembled on projection plates, then plates placed in holder XMT irradiation two levels (dual analysis). In this way, example, more than 200,000 250 × 150 μm can be interrogated less 1 h composition containing high density phases estimated. These isolated 3D analysis resolution and/or selected surface characterization XPS, TOF/SIMS, or other analytical instruments. Rapid used examination drill core samples, tailings any particulate particles.