作者: John M. Warman , Matthijs P. De Haas , Stephan W. F. M. Van Hovell tot Westerflier , Johannes J. M. Binsma , Zvonimir I. Kolar
DOI: 10.1021/J100352A048
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摘要: The transient conductivity resulting from pulsed irradiation (with 3-MeV electrons) of a single, high-resistivity (4 {times} 10{sup 7} {Omega} m) crystal CdS has been studied by nanosecond time-resolved microwave conductivity. ratio the electron-hole pair mobility to formation energy is determined be 42 {plus minus} 6 {minus}4} m{sup 2} V{sup {minus}1} s{sup {minus}1}/eV. For end-of-pulse concentrations less than ca. 19} {minus}3}, half-life electrons toward localization was 25 ns. With increasing concentration above this value, lifetime found become longer. This effect attributed trap saturation with estimated 3 {minus}3} (5 {minus}8} M) rate constant trapping 1.1 {minus}12} 3} (6.6 14} M{sup {minus}1}). main site thought singly ionized sulfur vacancy. No evidence for occurrence direct recombination, and an upper limit {minus}14} (ca. 2 13} {minus}1}) could placed on second-order process.