Automatic evaluation of wheat resistance to fusarium head blight using dual mask-rcnn deep learning frameworks in computer vision
作者： Wen-Hao Su , Jiajing Zhang , Ce Yang , Rae Page , Tamas Szinyei
DOI: 10.3390/RS13010026
关键词:
摘要: In many regions of the world, wheat is vulnerable to severe yield and quality losses from the fungus disease of Fusarium head blight (FHB). The development of resistant cultivars is one …
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