XPS analysis and microstructural characterization of a Ce/Tb mixed oxide supported on a lanthana-modified transition alumina
作者： A. Galtayries , G. Blanco , G. A. Cifredo , D. Finol , J. M. Gatica
DOI: 10.1002/(SICI)1096-9918(199910)27:10<941::AID-SIA657>3.0.CO;2-Y
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摘要: … XPS, the 4f level is pulled down by the core hole potential and the charge transfer occurs from the O 2p to Ce 4f … in the XPS analyses of powders of pure ceria or of Ce/Zr36 and Ce/La …
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