作者: Soo-Hyun Joo , Jae Kon Lee , Jin-Mo Koo , Sunghak Lee , Dong-Woo Suh
DOI: 10.1016/J.SCRIPTAMAT.2012.10.025
关键词:
摘要: Local strain analyses in a dual phase steel were performed using digital image correlation (DIC) method association with Ag nanodot patterning. The optimum size of the nanodots for DIC was estimated from error analyses. patterning sheds light on nanoscale local analysis due to its many advantages, such as high productivity, large area, easy control dot size, and, furthermore, good adhesion.