Effect of Electron Irradiation on Young's Modulus

作者: H. Dieckamp , A. Sosin

DOI: 10.1063/1.1722280

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摘要: Young's modulus and internal friction measurements are reported on high‐purity copper following electron bombardment. The is observed to rise rapidly with flux reaching an early saturation followed by a slow decrease. rapid attributed dislocation pinning. rate of temperature dependent in the range from −195°C about 0°C suggesting defect migration at low temperatures. decrease ``bulk effect'' due interstitial‐vacancy pairs.

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