Changes in a surface of polycrystalline aluminum upon bombardment with argon ions
作者： O. G. Ashkhotov , I. B. Ashkhotova , A. P. Bliev , T. T. Magkoev , D. A. Krymshokalova
DOI: 10.1134/S0036024414100033
关键词:
摘要: The interaction between argon ions and a natural oxide layer of polycrystalline aluminum is studied via Auger electron (AE) energy loss (EEL) spectroscopy. It found that bombardment with whose lower than the Al2O3 sputtering threshold results in accumulation bombarding interstitial surface voids, thus forming supersaturated solid solution target atoms nitrogen entrapped by ion beam from residual gas working chamber spectrometer.
springer.com
harvard.edu
sci-hub.se 参考文章(14)
Heinz Raether, Excitation of Plasmons and Interband Transitions by Electrons ,(1980)
K.L.I. Kobayashi, Y. Shiraki, Y. Katayama, Study of adsorption phenomena on aluminium by interatomic Auger transition spectroscopy: I. Initial oxidation of Al Surface Science. ,vol. 77, pp. 449- 457 ,(1978) , 10.1016/0039-6028(78)90132-2
E. Paparazzo, XPS, AES and EELS studies of Al surfaces Vacuum. ,vol. 62, pp. 47- 60 ,(2001) , 10.1016/S0042-207X(01)00123-3
S. Tanuma, C.J. Powell, D.R. Penn, Proposed formula for electron inelastic mean free paths based on calculations for 31 materials Surface Science. ,vol. 192, ,(1987) , 10.1016/S0039-6028(87)81156-1
Reinhard Glang, Leon I. Maissel, Paul P. Budenstein, Handbook of Thin Film Technology ,(1970)
G Gergely, M Menyhárd, A Sulyok, Some new possibilities in non-destructive depth profiling using secondary emission spectroscopy: REELS and EPES Vacuum. ,vol. 36, pp. 471- 475 ,(1986) , 10.1016/0042-207X(86)90230-7
J.K. Grepstad, P.O. Gartland, B.J. Slagsvold, Anisotropic work function of clean and smooth low-index faces of aluminium Surface Science. ,vol. 57, pp. 348- 362 ,(1976) , 10.1016/0039-6028(76)90187-4
S. D. Berger, I. G. Salisbury, R. H. Milne, D. Imeson, C. J. Humphreys, Electron energy-loss spectroscopy studies of nanometre-scale structures in alumina produced by intense electron-beam irradiation Philosophical Magazine Part B. ,vol. 55, pp. 341- 358 ,(1987) , 10.1080/13642818708208619
A. Benninghoven, A. Mueller, Secondary ion yields near 1 for some chemical compounds Physics Letters A. ,vol. 40, pp. 169- 170 ,(1972) , 10.1016/0375-9601(72)90844-4
R Kapsa, I Stará, D Zeze, B Gruzza, V Matolı́n, AES and EELS study of aluminium oxide thin films Thin Solid Films. ,vol. 317, pp. 77- 80 ,(1998) , 10.1016/S0040-6090(97)00663-9