作者: B. Balamurugan , I. Aruna , B. R. Mehta , S. M. Shivaprasad
DOI: 10.1103/PHYSREVB.69.165419
关键词:
摘要: X-ray photoemission spectroscopy and optical absorption studies have been carried out on ${\mathrm{Cu}}_{2}\mathrm{O}$ nanoparticles prepared using the activated reactive evaporation technique. A strong shift of valence band edge (from 0.7 to 1.8 eV) has observed reduction nanoparticle size from 20 nm 4 nm. The size-dependent modifications in energy level diagram ${\mathrm{m}\mathrm{e}\mathrm{t}\mathrm{a}\mathrm{l}\ensuremath{-}\mathrm{C}\mathrm{u}}_{2}\mathrm{O}$ Schottky junction characteristics confirm observation inversion conductivity type $p$-type bulk $n$-type at lower dimensions. This study can initiate a further methodology for tailoring semiconductor properties material by controlling size.