A note on the use of X-ray counter-spectrometers for single-crystal measurements

摘要: Some experiments are described in which a counter-spectrometer method is compared with an X-ray photographic as means of determining the integrated reflexion number reflexions. The advantages and limitations photographic, ionization counter-spectrometers discussed, it concluded that for long exposures spectrometer sensitive used few minutes more than spectrometer. For convenience speed measurement probably best instrument.