Response model of resistance-type microbolometer

作者: Xiubao Sui , Qian Chen , Guohua Gu , Ning Liu

DOI: 10.1007/S10043-010-0094-4

关键词:

摘要: There are certain limitations in the application of uncooled focal plane array (FPA) detectors owing to shortage response model that transforms bias voltage analog output at a constant radiation power; Moreover, affects input gain. In this study, we established microbolometer through examining detection theory and heat balance equation under condition pulse bias. establishment process, simplified order acquire simple answer. The experimental data show that, full variable range voltages, biggest difference between experiment is about 0.7 K. This can reflect real responses microbolometers with only small differences, which acceptable engineering applications.

参考文章(6)
Peiguo Hou, Yanju Wang, Yutian Wang, Zong Meng, The application study of the infrared imaging technology on the transformer fault diagnosis Infrared Components and Their Applications. ,vol. 5640, pp. 253- 259 ,(2005) , 10.1117/12.575416
Franz Kohl, Franz Keplinger, Artur Jachimowicz, Johannes Schalko, A model of metal film resistance bolometers based on the electro-thermal feedback effect Sensors and Actuators A-physical. ,vol. 115, pp. 308- 317 ,(2004) , 10.1016/J.SNA.2004.03.057
Gurdip Singh Deep, Modeling of the hysteretic metal-insulator transition in a vanadium dioxide infrared detector Optical Engineering. ,vol. 41, pp. 2582- 2588 ,(2002) , 10.1117/1.1501095
Masaki Hirota, Yoshimi Ohta, Yasuhiro Fukuyama, Low-cost thermo-electric infrared FPAs and their automotive applications Proceedings of SPIE, the International Society for Optical Engineering. ,vol. 6940, pp. 694032- ,(2008) , 10.1117/12.780725
L. A. L. de Almeida, G. S. Deep, A. M. N. Lima, I. A. Khrebtov, V. G. Malyarov, H. Neff, Modeling and performance of vanadium-oxide transition edge microbolometers Applied Physics Letters. ,vol. 85, pp. 3605- 3607 ,(2004) , 10.1063/1.1808890
Michael A. Dem'yanenko, Improved bias equalization method for suppression temperature-induced errors in microbolometer FPA over 20 K substrate temperature change Infrared Technology and Applications XXXIII. ,vol. 6542, pp. 654222- ,(2007) , 10.1117/12.718975