Application of the Berreman Effect to the Characterization of TiO2 Thin Layers Formed onto Titanium Substrates
作者： M.B. Parodi , L. Rodr’guez , L. Pazos , J. González Ruiz , A. Paz Ramos
DOI: 10.1016/J.MSPRO.2012.06.063
关键词:
摘要: Diffuse reflectance infrared Fourier transform spectroscopy (DRIFT) with polarized radiation is employed to characterize TiO2 thin films thermally grown on Ti substrates, which exhibit the so-called Berreman effect. The DRIFT analysis of in context effect simple and fast, allows identification crystalline/amorphous structure layers even presence other coatings, such as hydroxyapatite deposits, top titanium oxide films.
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