作者: R. Nowak , T. Sekino , S. Maruno , K. Niihara
DOI: 10.1063/1.115713
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摘要: This work clarifies the origin of characteristic discontinuities registered during deformation (1010) plane sapphire, by means depth sensing indentation experiments with a spherical indenter. The sudden increase plasticity crystal was found to be caused twinning process. calculation and analysis distribution resolved shear stresses under indenter predicted features surface deformation. high resolution microscopic examination residual impressions confirmed theoretical prediction.