Deposition of (Ni80Fe20)100–xCrx Alloy Thin Films for Potential Applications in Magnetic Recording Media
作者： Sinan Diken , Omer Ozkaya , Sukru Cakmaktepe
DOI: 10.1109/TMAG.2016.2598527
关键词:
摘要: This paper reports the results of investigation on deposition and characterization (Ni80Fe20)100– x Cr ( $x = 20$ , 40, 60, 80) alloy thin films onto Si (100) substrates at room temperature by direct current (dc) magnetron sputtering. Hysteresis loops vibrating sample magnetometer graphs indicate that addition increases coercivity (Ni80Fe20)80Cr20 (Ni80Fe20)60Cr40 films, whereas (Ni80Fe20)40Cr60 (Ni80Fe20)20Cr80 no significant hysteresis loops. X-ray diffraction (XRD) confirm film samples are found to have face-centered-cubic structure with preferred orientation mostly along (111) plane. In addition, crystallite size calculations were obtained from Scherrer equation. Finally, surface topography is analyzed means atomic force microscopy technique correlated XRD patterns. Our suggest has a influence magnetic structural properties films.
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