作者: U. Bauer , J. Choi , J. Wu , H. Chen , Z. Q. Qiu
DOI: 10.1103/PHYSREVB.76.184415
关键词:
摘要: Ultrathin Ni films are grown on vicinal Cu(001) substrate with the steps parallel to [110] axis and angle ranging from 0\ifmmode^\circ\else\textdegree\fi{} 12\ifmmode^\circ\else\textdegree\fi{}. Spin reorientation transition (SRT) thickness of film is studied in situ using magneto-optic Kerr effect step decoration Mn, Fe, Co, Cu, Pd. Surprisingly, SRT only affected by Co other elements having little thickness. Further experiment normal growth a thin separation Cu layer confirms that comes Ni-Co interaction at edges.