作者: Hiroki Ogawa , Hiroyasu Masunaga , Sono Sasaki , Shunji Goto , Takashi Tanaka
DOI: 10.1038/PJ.2012.194
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摘要: The new experimental system has been launched by coupling with the measurement techniques, which are grazing incidence small/wide-angle X-ray Scattering (GISWAXS) and diffraction (GIXD), as well reflectivity (XR), at BL03XU of SPring-8. Using this integrated system, we can achieve to measure hierarchical structure same sample.