Dynamic electro-thermal simulation of microsystems—a review
作者： Tamara Bechtold , Evgenii B Rudnyi , Jan G Korvink
DOI: 10.1088/0960-1317/15/11/R01
关键词:
摘要: An overview of electro-thermal modeling of microsystems is presented. We consider the most important coupling between thermal and electrical phenomena, and then focus on the …
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modelreduction.com 参考文章(98)
Arokia Nathan, Henry Baltes, Siegfried Selberherr (Editor), Microtransducer CAD: Physical and Computational Aspects Microtransducer CAD: Physical and Computational Aspects. pp. 427- 427 ,(1999)
Gal Berkooz, John Leask Lumley, Philip Holmes, Turbulence, Coherent Structures, Dynamical Systems and Symmetry ,(1996)
José M. Badía, Peter Benner, Rafael Mayo, Enrique S. Quintana-Ortí, Parallel Algorithms for Balanced Truncation Model Reduction of Sparse Systems Applied Parallel Computing. State of the Art in Scientific Computing. pp. 267- 275 ,(2006) , 10.1007/11558958_32
Ted Belytschko, Wing Kam Liu, Brian Moran, Khalil Elkhodary, Nonlinear Finite Elements for Continua and Structures ,(2000)
Jan G. Korvink, Evgenii B. Rudnyi, Tamara Bechtold, Automatic Generation of Compact Electro-Thermal Models for Semiconductor Devices IEICE Transactions on Electronics. pp. 459- 465 ,(2003)
Jan G Korvink, Oliver Paul, MEMS: A Practical Guide to Design, Analysis, and Applications ,(2005)
Jan G. Korvink, Evgenii B. Rudnyi, Andreas Greiner, Zhenyu Liu, MEMS and NEMS Simulation MEMS#R##N#A Practical Guide to Design, Analysis, and Applications. pp. 93- 186 ,(2006) , 10.1007/978-3-540-33655-6_3
Athanasios C. Antoulas, Dan C. Sorensen, Approximation of large-scale dynamical systems: an overview International Journal of Applied Mathematics and Computer Science. ,vol. 11, pp. 1093- 1121 ,(2001)
P.R. Wilson, J.N. Ross, A.D. Brown, A. Rushton, Multiple domain behavioral modeling using VHDL-AMS international symposium on circuits and systems. ,vol. 5, pp. 644- 647 ,(2004) , 10.1109/ISCAS.2004.1329890
C.J.M. Lasance, D. Den Hertog, P. Stehouwer, Creation and evaluation of compact models for thermal characterisation using dedicated optimisation software semiconductor thermal measurement and management symposium. pp. 189- 200 ,(1999) , 10.1109/STHERM.1999.762447