Correlation of electrical conductivity and other vigor tests with field emergence of soybean seedlings

作者: J. A. Paiva-Aguero , D. Perecin , Roberval Daiton Vieira , S. R M Bittencourt

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摘要: Seeds from six soybean cultivars (Cristalina, IAC 31-Foscarin, IAC-15, UFV-10, IAC-14 and IAS-5) five (1AC IAC-14, IAS-5 Iguacu) were evaluated in 1993 1994, respectively, terms of physiological seed quality by the mechanical damage (MD), standard germination (SG), accelerated aging (AA), electrical conductivity (EC), seedling field emergence (FE) tests. Significant correlations detected between SG, AA EC FE. However, cultivar or year, degree association among these parameters can change based on environmental conditions each year.

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