Calculated Stark widths of isolated S(III) and S(IV) lines

作者: John D. Hey , Peter Breger

DOI: 10.1016/0022-4073(80)90012-6

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摘要: Calculations have been performed on the electron-impact broadening of isolated lines from doubly-ionized and triply-ionized sulphur emitted a plasma electron density 1017 cm-3 temperature 28,500°K. These compared with results measurements by Platisa, Popovic, Dimitrijevic, Konjevic low-pressure, pulsed arc. Good overall agreement has obtained for both ionization stages, in confirmation our earlier conclusions based similar comparison oxygen ion lines. The present calculations upon two simplified models Griem classical-path approximation Sahal-Brechot. Our calculated widths are better experiment than values first models; multiplets, where is possible, good found We conclude that model, whereby effective Gaunt factor calculated, capable predicting reliable Stark Comparison [for S(III) indicates that, provided sufficiently complete set perturbing levels used calculations, formula ḡ may also be below-threshold energies determination elastic contribution to broadening. For S(IV), an ambiguity remains this regard, owing chiefly scarcity available experimental data.

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