作者: Xirong Jiang , Stacey F. Bent
DOI: 10.1149/1.2789301
关键词:
摘要: Using (methylcyclopentadienyl)trimethylplatinum (MeCpPtMe 3 ) and oxygen as precursors, Pt has been deposited by atomic layer deposition (ALD) on the surfaces of yttria-stabilized zirconia (YSZ), a solid oxide electrolyte, well oxide-covered silicon. Ex situ analyses have carried out to examine properties both as-deposited postannealed films. X-ray photoelectron spectroscopy measurements demonstrate that there are no detectable impurities in films, four-point probe show resistivity for 30.2 nm film is low 18.3 μΩ cm. The use area-selective ALD deposit patterned also investigated. By coating these same substrates with octadecyltrichlorosilane (ODTS) self-assembled monolayers (SAMs), can be successfully blocked. Furthermore, it shown transferring ODTS SAMs microcontact printing (μCP) using stamps, platinum thin films grown selectively SAM-free surface regions. Features sizes small 2 μm this combined ALD-μCP method; resolution limited printed pattern and, likely, achieved at dimensions significantly smaller than micrometer.