作者: G Vayakis
DOI: 10.1016/S0920-3796(96)00594-7
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摘要: Abstract A generic reflectometry is modelled as a device for launching and receiving radiation at number of microwave frequencies, uniformly distributed over specified bandwidth. The effect density fluctuations phase error each frequency. distortion has known correlation length in frequency space, allowing semi-analytical prediction the resultant on time delay. Specific techniques are compared to model: sweep, differential phase, AM sine FM modulation. There no significant difference between them model their response same type error. An implication that there situations where profile details unrecoverable by certain implementations short scale. These arise when strong short, conditions found plasma edge.