作者: Vineet Barwal , Sajid Husain , Nilamani Behera , Ekta Goyat , Sujeet Chaudhary
DOI: 10.1063/1.5004425
关键词:
摘要: Angular dependent magnetization reversal has been investigated in Co2MnAl (CMA) full Heusler alloy thin films grown on Si(100) at different growth temperatures (Ts) by DC-magnetron sputtering. An M-shaped curve is observed the in-plane angular (0°–360°) coercivity (ADC) magneto-optical Kerr effect measurements. The dependence of Ts detail to bring out structure-property correlation with regards ADC these polycrystalline CMA films. This ( behavior) well described two-phase model, which a combination Kondorsky (domain wall motion) and Stoner Wohlfarth (coherent rotation) models. In this starts depinning domain walls, their gradual displacement explained higher field (when walls merge), system follows coherent rotation before reaching its saturation following model. Fu...