Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy.

作者: Naoya Shibata , Scott D. Findlay , Takao Matsumoto , Yuji Kohno , Takehito Seki

DOI: 10.1021/ACS.ACCOUNTS.7B00123

关键词:

摘要: Conspectus The functional properties of materials and devices are critically determined by the electromagnetic field structures formed inside them, especially at nanointerface and surface regions, because such structures are strongly associated with the dynamics of electrons, holes and ions. To understand the fundamental origin of many exotic properties in modern materials and devices, it is essential to directly characterize local electromagnetic field structures at such defect regions, even down to atomic dimensions. In recent years …

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