作者: Lin-Zhu Jin , Tadashi Dohi , Shunji Osaki
DOI: 10.1109/ICQR2MSE.2011.5976641
关键词:
摘要: For large scale software systems with a huge number of codes, it may be often useful to regard the fault-counting processes observed in testing phase as continuous-state stochastic processes. In this paper we introduce two types reliability models; diffusion time-dependent drift and non-stationary gamma wear processes, compare them usual non-homogeneous Poisson We expect that our models can provide better goodness-of-fit performance than existing many cases convenient assessment tools estimate reliability.