Exposure of Equal-Channel Angular Extruded Tungsten to Deuterium Plasma
作者： Feng Liu , Yuping Xu , Haishan Zhou , Sixiang Zhao , Bo Li
DOI: 10.1088/1009-0630/16/17/7/12
关键词:
摘要: Surface morphology and deuterium retention in ultrafine-grained tungsten fabricated by equal-channel angular pressing (ECAP) have been examined after exposure to a low energy, high-flux (D) plasma at fluences of 3×1024 D/m2 1×1025 temperature range 100°C-150°C. The methods used were scanning electron microscopy (SEM) thermal desorption spectroscopy (TDS). Sparse small blisters (~0.1 μm) observed SEM D irradiation on every irradiated surface; yet they did not exhibit significant structure or fluence dependence. Larger protrusions appeared subsequent TDS heating up 1000°C. results showed single peak ~220°C for all samples the increased with increasing numbers extrusion passes, i.e., decrease grain sizes. this should be attributed faster diffusion along larger volume fraction boundaries introduced ECAP.
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