Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer

摘要: To better understand the fundamentals of solid lubrication, microstructural analyses on wear scar surface and contact interface Mo–W–S–Se composite films produced by pulsed laser deposition were completed. Focused ion beam (FIB), transmission electron microscopy (TEM), X-ray energy dispersive spectroscopy employed to study cross-sectional microstructure chemistry scars. In particular, a novel microtribometer was built for in situ tribological measurements within FIB microscope. The sliding tip welded in film under load re-deposition sputtering materials from cut tip. Using this technique, TEM specimens prepared precisely at point without tip/film separation. Here, is critically important retaining lubricant as formed between It provides unique ability stop sliding, section contact, reveal changes that disrupting interface. performed both regions just past reorientation recrystallization revealed.