Probe apparatus and method for measuring thermoelectric properties of materials
作者： Uttam Shyamalindu Ghoshal
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摘要: A method and apparatus for measuring characterizing microscopic thermoelectric material samples using scanning microscopes. The relies on concurrent thermal electrical measurements probes, extends the applicability of microscopes (SThMs) to characterization materials. probe makes use two thermocouples measure voltages at tip base a cone probe. From these voltages, from voltage measured across sample material, Seebeck coefficient, conductivity resistance can be accurately determined.
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