Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples
作者： R Resch , G Friedbacher , M Grasserbauer , T Kanniainen , S Lindroos
DOI: 10.1016/S0169-4332(97)00217-1
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摘要: In this study lateral force microscopy (LFM) and modulation (FM) have been used for investigations on PbS thin films deposited glass substrates with the successive ionic layer adsorption reaction method (SILAR). Information of friction surface elasticity obtained by scanning revealed local properties films, which to distinguish film constituents from environmental contamination and/or due preparation process. Furthermore, these (SFM) applications yielded information about coverage is particularly important in early stages deposition.
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