Method and apparatus for measuring pretilt angle of liquid crystal material

摘要: PURPOSE:To enable the measurement of a pretilt angle even through thickness liquid crystal layer display device is below specified value permitting polarized light to enter substrate and be reflected totally determine logarithmic ratio reflection factor parallel with surface that vertical surface. CONSTITUTION:A sample 7 has an orientated film 9 on internal element (e.g. Si or Ge higher in refractive index than 11) 11 sandwiched between opposed 10. Measuring leaving source 3 (infrared rays are optimum) turned linearly by passing interferrometer 4 polarizer 5, enters 8 8, reaches detector 6. The 5 so set total becomes (vertical) electric field vector measure Rp (Rs). A data processing section 2 calculated bicolor absorbance Dsp=-log (Rs)/-log (Rp). Since DsP corresponds uniquely angle, can measured immediately from Dsp using calibration curve drawn previously.