作者: John F. Ebersole , Stanley S. Ballard , James Steve Browder
DOI: 10.1364/AO.11.000844
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摘要: An apparatus has been designed and constructed for measuring the coefficient of linear thermal expansion in 30–250°C temperature range samples as small 13 mm length 6 diameter. Similarities between this one previously built measurements from room down to 10 K are reviewed; important modifications appropriate high discussed detail. Measurements were made at 25°C intervals on two infrared-transmitting optical materials: polycrystalline cadmium sulfide (Eastman Kodak Co.) chalcogenide glass 20, composition Ge33Se55As12 (Texas Instruments, Inc.). also a sample Corning crown 8263; results compared with data. Finally, it is shown that coefficients determined compatible those obtained above-mentioned low device.