Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy,
Scanning Electron Microscopy and X-Ray Microanalysis Transactions of the American Microscopical Society. ,vol. 102, pp. 59- ,(2018) ,
10.1007/978-1-4939-6676-9