Starch granule surface imaging using low-voltage scanning electron microscopy and atomic force microscopy

摘要: Abstract High resolution imaging of wheat and potato starch granule surfaces has been performed using low-voltage scanning electron microscopy atomic force microscopy. The complimentary images uncoated granules demonstrate that the two types possess substantially different surface topologies; many protrusions (100–300 nm in diameter), above a flatter containing 20–50 structures, whilst possesses far fewer generally smoother composed ≈20 structures. are believed to be carbohydrate nature thus represent ends amylopectin side-chain clusters at surface.