Microstructure statistics–property relations of silver particle-based interconnects

作者: A. Gillman , M.J.G.H. Roelofs , K. Matouš , V.G. Kouznetsova , O. van der Sluis

DOI: 10.1016/J.MATDES.2017.01.005

关键词:

摘要: This paper presents a novel approach for establishing microstructure statistics-property relations silver particle-based thermal interface material (TIM). Several sintered TIMs have been prepared under different processing conditions, generating samples with distinct microstructures. The 3D is revealed and visualized using the combination of Focussed Ion Beam (FIB) milling Scanning Electron Microscopy (SEM) imaging. Representative synthetic model microstructures generated based on Gaussian random field models, having well defined analytical descriptions. statistical characteristics models are shown to good correspondence, indicating that linear effective properties these complex materials can be predicted estimates available models. verified by computing elastic computational homogenization finite element real samples. homogenization, providing reference solution, higher-order in very agreement. These results used development new materials, whereby expensive time consuming property characterization replaced efficient estimation

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