Measuring Point Defect Density in Individual Carbon Nanotubes Using Polarization-Dependent X-ray

作者： Xavier Gillon , Xiaoxing Ke , Jean-Jacques Pireaux , Microscopy Felten , Michal Gulas

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摘要: The presence of defects in carbon nanotubes strongly modifies their electrical, mechanical, and chemical properties. It was long thought undesirable, but recent experiments have shown that introduction structural using ion or electron irradiation can lead to novel nanodevices. We demonstrate a method for detecting quantifying point defect density individual (CNTs) based on measuring the polarizationdependence(lineardichroism)oftheC1s i*transitionatspecificlocationsalongindividualCNTs with scanning transmission X-ray microscope (STXM). show STXM be used probe CNTs high spatial resolution. quantitative relationship between dose, nanotube diameter, explored by purposely irradiating selected sections kiloelectronvolt (keV) Gaions. Our results establish polarization-dependent microscopy as new very powerful characterization technique other anisotropic nanostructures.

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Measuring Point Defect Density in Individual Carbon Nanotubes Using Polarization-Dependent X-ray

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Measuring Point Defect Density in Individual Carbon Nanotubes Using Polarization-Dependent X-ray

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