Removal of an iron matrix with polyoxyethylene-type surfactant-coated amberlite XAD-4 for the determination of trace impurities in high-purity iron.

作者: Hiroaki Matsumiya , Shigeru Furuzawa , Masataka Hiraide

DOI: 10.1021/AC0504114

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摘要: Admicellar sorbents for the removal of an iron matrix were prepared determination trace impurities in high-purity iron. A 1.0-g amount Amberlite XAD-4 (macroreticular styrene−divinylbenzene copolymer) was coated with 0.14−1.3 mmol polyoxyethylene-type surfactants, including polyoxyethylene-4-tert-octylphenoxy ethers (Triton X series) and polyoxyethylene-4-isononylphenoxy (PONPEs). The surfactant-coated packed into a polypropylene column (7 mm i.d. × 50 high). 5.0-cm3 volume sample solution passed through at flow rate 0.5 cm3 min-1. Milligram amounts iron(III) effectively sorbed on from 8 mol dm-3 hydrochloric acid solutions. Among surfactants tested, polyoxyethylene(20)-4-isononylphenoxy ether (PONPE-20) showed best performance:  leaked PONPE-20 4 μg when 25 mg introduced onto column. Trace elements, such as Ti(IV), Cr(III), Mn(II), Co(II), Ni(II), Cu(II), Zn(II), Ag(I...

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