Analytical system with electrothermal atomizer and mass spectrometer for atomic and molecular analysis
作者： Hermann Wollnik , Heinz Falk
DOI:
关键词:
摘要: The analytical system for measuring the concentrations of elemental or molecular constituents an existing solid, liquid aerosol sample, sample being dried by electrothermal atomizer, reduced to ashes, if necessary, vaporized, vapor ionized, resulting ions supplied during a short time in comparison with storage preferably simultaneously operating mass spectrometer, and frequency respective ion masses measured.
lens.org 参考文章(10)
Tsutomu Komoda, Yasuhiro Mitsui, Satoshi Shimura, Plasma ion source mass spectrometer ,(1989)
Richard N. Zare, Evan R. Williams, Surface induced dissociation with reflectron time-of-flight mass spectrometry ,(1991)
Matija Mihelcic, Kurt Wingerath, Paul S. Bechtold, Time-of-flight spectrometer with gridless ion source ,(1989)
Heinz Falk, Walter Slavin, Graphite Furnaces as Atomizers and Emission Sources in Analytical Atomic Spectrometry Critical Reviews in Analytical Chemistry. ,vol. 19, pp. 29- 64 ,(1988) , 10.1080/10408348808542807
R. Grix, R. Kutscher, G. Li, U. Grüner, H. Wollnik, H. Matsuda, A time‐of‐flight mass analyzer with high resolving power Rapid Communications in Mass Spectrometry. ,vol. 2, pp. 83- 85 ,(1988) , 10.1002/RCM.1290020503
Loos-Vollebregt Margaretha T C De, Petrus C Bank, Galan Leo De, Method and apparatus for electrothermal atomization of samples ,(1988)
Robert A. Howard, Ernest P. Williams, Alan R. Forster, Method and apparatus for analysis of material ,(1986)
William B. Henderson, Demand modulated atomization apparatus and method for plasma spectroscopy ,(1988)
Raimund Dipl Phys Grix, Roland Dipl Phys Kutscher, Hermann Prof Dr Wollnik, Gang Qiang Li, Speicherionenquelle fuer flugzeit-massenspektrometer ,(1987)
James A. Holcombe, Thomas Rettberg, Method and apparatus for concentrating a selected element for atomic spectroscopy United States Patent and Trademark Office. ,(1983) , 10.26153/TSW/4387