作者: M. A. G. Aranda , E. R. Losilla , A. Cabeza , S. Bruque
DOI: 10.1107/S0021889897006419
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摘要: Rietveld refinement of powder diffraction data is a very popular and powerful technique. Several effects in the patterns, such as anisotropic peak broadening, preferred orientation or extinction, are properly taken into account; however, asymmetry due to axial divergence remains problematic. Recently, seminal paper by Finger, Cox & Jephcoat [J. Appl. Cryst. (1994), 27, 892–900] proved that this effect can be treated with parameters related diffractometer optic. refinements asymmetric profiles obtained synchrotron laboratory X-ray neutron radiation reported. Furthermore, structure Li1.8(Hf1.2Fe0.8)(PO4)3 (λ ≃ 0.4 A) on world's highest resolution (at BM16, ESRF) presented. The fit pattern which has peaks excellent, indicated low value Rwp = 8.1% flat difference curve. It said no longer problem.