Weakly absorbing layers: interferometric determination of their optical parameters
作者： Y. Demner , J. Shamir
DOI: 10.1364/AO.17.003738
关键词:
摘要: The determination of the absorption very weakly absorbing thin films and film systems is a difficult problem. In present work previously suggested method generalized improved in order to apply it for multilayers. case single layers, measurement adequate determine also thickness refractive index film. main advantages described here are its simplicity, self-calibrating nature, high sensitivity absorption.
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