Magnetic Properties of Microfabricated Mn x Ga Circler Dot Arrays

摘要: Mn-Ga alloy attracts much attention as a new material for the spintronics device and high-density magnetic storage media because of its high uniaxial crystalline magnet anisotropy (∼ 107erg/cm3) [1]. A lot studies thin films have been performed [2], however, there are few reports about film in submicron size. In this study, Mn x Ga circular dot arrays microfabricated relation between properties diameter dots investigated order to obtain design guide line high-performance recording. The ware prepared by an electron beam deposition system with bulk materials synthesized arc melting. Cr buffer layer (5 nm) (10 ∼ 20 were stacked on single crystal MgO (100) substrate, finally, capping was deposited. from continuous through lithography Ar ion milling. Diameter $D$ varied 100 nm 3000 nm. composition identified energy dispersive X-ray spectrometer (EDX). Surface buffer, layers monitored reflection diffraction (RHEED) situ observation. Crystalline structure characterized (XRD). Magnetic super conducting quantum interference devise magnetometer (SQUID) poler magneto optical Kerr effect ( $\mu$ -MOKE) maximum field $\pm 70$ kOe 20$ kOe, respectively. From XRD pattern 1.0 deposited at 300 °C annealed 500 °C, (001) superlattice peak (002) fundamental observed, indicating that L1 0 ordered formed. For 1.5 $\text{Mn}_{3.2}$ Ga, peaks $L1_{0}$ or $D0_{22}$ not confirmed. $M_{\mathrm{s}}=170$ emu/ cm3 $H_{\mathrm{c}}=10.5$ observed magnetization curve out-of-plane applied field. After microfabrication film, $H_{\mathrm{c}} \ = 14.6$ $H_{\mathrm{c}}$ showed increase tendency decrease D. will be discussed detail.