摘要: List of Contributors. 1. The Development Automated Diffraction in Scanning and Transmission Electron Microscopy D.J. Dingley. 2. Theoretical Framework for Backscatter V. Randle. 3. Representation Texture Orientation Space K. Rajan. 4. Rodriques-Frank Representations Crystallographic 5. Fundamentals EBSD S.I. Wright. 6. Studies on the Accuracy Measurements M.C. Demirel, B.S. El-Dasher, B.L. Adams, A.D. Rollett. 7. Phase Identification Using Microscope J.R. Michael. 8. Three-Dimensional Imaging Jensen. 9. Diffraction: Present State Prospects R.A. Schwarzer. 10. EBSD: Buying a Systems A. Eades. 11. Hardware Software Optimization Mapping P.P. Camus. 12. An Acquisition Processing System P. Rolland, K.G. Dicks. 13. Advanced Capabilities Wright, D.P. Field, 14. Strategies Analysis Datasets W.E. King, J.S. Stolken, M. Kumar, A.J. Schwartz. 15. Structure-Property Relations: EBSD-Based Materials-Sensitive Design Henrie, L.L. Howell, R.J. Balling. 16. Use Data Mesoscale Numerical Analyses R. Becker, H. Weiland. 17. Characterization Deformed Microstructures 18. Anisotropic Plasticity Modeling Incorporating Tantalum Zirconium J.F. Bingert, G.C. Kaschner, T.A. Mason, P.J. Maudlin, G.T. Gray III. 19. Measuring Strains Wilkinson. 20. Residual Plastic Strain Materials E.M. Lehockey, Yang-Pi Lin, O.E. Lepik. 21.EBSD Contra TEM Aluminum Single Crystal Xiaoxu Huang, 22. Continuous Recrystallization Grain Boundaries Superplastic Alloy T.R. McNelley. 23. Facets Other Surfaces 24. Ceramic J.K. Farrer, Michael, C.B. Carter. 25. Boundary Character Based Polycrystalline High Temperature Superconducting Wires Goyal. Index.
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