Simplified mathematical approach to XRF secondary excitation
作者： C. Bui , M. Milazzo , C. Sironi
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摘要: A secondary effect simplified mathematical expression (SESME) was developed to calculate, in a very simple way, the XRF enhancement by excitation. This approximate methods makes possible use of algorithm case finite thickness sample also. The numerical approximations are quantitatively estimated for samples infinite and physical meaning formal is discussed.
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