XY-TOF technique for large ion source mass spectrometers
作者： T Jalowy , R Neugebauer , K.O Groeneveld , C.R Ponciano , L.S Farenzena
DOI: 10.1016/S1387-3806(02)00735-2
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摘要: Abstract The combination of time-of-flight (TOF) with two-dimensional position-sensitive ( XY ) ion detection techniques is employed to increase sensitivity gas mass spectrometers. For this, the length sources significantly increased without deteriorating resolution; this achieved by using information correct TOFs ions produced in collisions. dynamics expressions for such -TOF method are deduced. pressure may be kept at a uniform value all over cell facilitate accurate absolute measurements. Experimental results 150 keV neutral H (H 0 )-beam colliding He–Ne–Ar mixture shown before and after compensation.
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