Memory device with programmable self-refreshing and testing methods therefore

摘要: A programmable self-timed refresh circuit for a semiconductor memory array and methods programming the self-refresh rate non-invasively deterministically testing establishing/verifying wait state interval operation. The includes oscillator that outputs clocking signal, pattern generator first signal second pattern. is fed to counter which also receives signal. pulse whenever count driven by reaches digital representation corresponding generated generator. Refresh control logic connected receive respond thereto refreshing portion of device. employed set Multiple are forth.