Subsurface characterization of carbon nanotubes in polymer composites via quantitative electric force microscopy
作者： Minhua Zhao , Xiaohong Gu , Sharon E Lowther , Cheol Park , Y C Jean
DOI: 10.1088/0957-4484/21/22/225702
关键词:
摘要: Subsurface characterization of carbon nanotubes?(CNTs) dispersed in free-standing polymer composite films was achieved via quantitative electric force microscopy?(EFM). The effects relative humidity, EFM probe geometry, tip?sample distance and bias voltage on the contrast were studied. Non-parabolic dependence signal subsurface CNTs composites observed a new mechanism proposed taking consideration capacitive coupling as well coulombic coupling. We anticipate that this technique will be useful tool for non-destructive high dielectric constant nanostructures low matrices.
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sci-hub.se 参考文章(46)
Thomas Sand Jespersen, Jesper Nygård, Mapping of individual carbon nanotubes in polymer/nanotube composites using electrostatic force microscopy Applied Physics Letters. ,vol. 90, pp. 183108- ,(2007) , 10.1063/1.2734920
S. Belaidi, P. Girard, G. Leveque, ELECTROSTATIC FORCES ACTING ON THE TIP IN ATOMIC FORCE MICROSCOPY : MODELIZATION AND COMPARISON WITH ANALYTIC EXPRESSIONS Journal of Applied Physics. ,vol. 81, pp. 1023- 1030 ,(1997) , 10.1063/1.363884
J. Waddell, R. Ou, C. J. Capozzi, S. Gupta, C. A. Parker, R. A. Gerhardt, K. Seal, S. V. Kalinin, A. P. Baddorf, Detection of percolating paths in polyhedral segregated network composites using electrostatic force microscopy and conductive atomic force microscopy Applied Physics Letters. ,vol. 95, pp. 233122- ,(2009) , 10.1063/1.3265742
Todd Gross, Shaoning Yao, Sri Satyanarayana, Detection of nanoscale etch and ash damage to nanoporous methyl silsesquioxane using electrostatic force microscopy Microelectronic Engineering. ,vol. 85, pp. 401- 407 ,(2008) , 10.1016/J.MEE.2007.07.014
Joannie Chin, Eric Byrd, Ned Embree, Jason Garver, Brian Dickens, Tom Finn, Jonathan Martin, Accelerated UV weathering device based on integrating sphere technology Review of Scientific Instruments. ,vol. 75, pp. 4951- 4959 ,(2004) , 10.1063/1.1808916
Josef Z. Kovacs, Wolfgang Bauhofer, Jan Roman Pauls, Karl Schulte, Kjer Andresen, Claudia Pardo Garcia, Michael Schossig, Analyzing the quality of carbon nanotube dispersions in polymers using scanning electron microscopy Carbon. ,vol. 45, pp. 1279- 1288 ,(2007) , 10.15480/882.267
M.A. Kader, D. Choi, S.K. Lee, C. Nah, Morphology of conducting filler-reinforced nitrile rubber composites by electrostatic force microscopy Polymer Testing. ,vol. 24, pp. 363- 366 ,(2005) , 10.1016/J.POLYMERTESTING.2004.10.004
C. Schönenberger, S. F. Alvarado, Observation of single charge carriers by force microscopy Physical Review Letters. ,vol. 65, pp. 3162- 3164 ,(1990) , 10.1103/PHYSREVLETT.65.3162
Neil R. Wilson, Julie V. Macpherson, Enhanced resolution electric force microscopy with single-wall carbon nanotube tips Journal of Applied Physics. ,vol. 96, pp. 3565- 3567 ,(2004) , 10.1063/1.1781759
Gajendra S Shekhawat, Vinayak P Dravid, Nanoscale imaging of buried structures via scanning near-field ultrasound holography. Science. ,vol. 310, pp. 89- 92 ,(2005) , 10.1126/SCIENCE.1117694