Characterization of a High-TC Superconducting Thin Film by the Ring Resonator Method
作者： P. Meisse , H. Baudrand , M. Chaubet , L. Lapierre , M. Pyee
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摘要: We describe the modelization of an experimental set up for a new microwave measurement technique characterization high critical temperature superconductor (HTCS) thin layer. This approach allows connexion between HTCS parameters, like surface resistance in microwaves, and measurements. The preliminary results are good agreements with some previously reported ones.
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