作者: G. Drera , F. Banfi , F. Federici Canova , P. Borghetti , L. Sangaletti
DOI: 10.1063/1.3549177
关键词:
摘要: Experimental evidence of differences in the electronic properties an insulating and a conducting SrTiO3/LaAlO3 interface is provided by soft x-ray spectroscopies. While core level photoemission measurements show that only at Ti ions with 3+ ionization state are present, using resonant absorption spectroscopies, it shown both samples in-gap states 3d character but their density higher interface.