Method for correction for chromatic aberration and exposure apparatus using the same

作者: Takeshi Ishihara , Masaru Sasago , Masayuki Endo , Kazufumi Ogawa

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摘要: Disclosed is an exposure apparatus used in a photolithographic process fabrication of semiconductor devices. More particularly, the using excimer laser, beam splitter, mirror and lens for correction chromatic aberration are combined alignment optical system. Furthermore, disposed at opposite side image pickup camera key by way splitter.

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