作者: P. Gassmann , R. Franchy , H. Ibach
DOI: 10.1016/0039-6028(94)90572-X
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摘要: Abstract We have investigated the phase transitions and structure of thin aluminum oxide layers on NiAl(001) using high-resolution electron energy loss spectroscopy (HREELS), low-energy diffraction (LEED) Auger (AES). The films were prepared either by oxygen adsorption at 300 K annealing to different temperatures or oxidation up 1500 K. demonstrated that in connection with LEED AES data HREEL spectra allow determination alumina layers. Different phases Al2O3 been observed depending temperature. losses are high-frequency branches ω+ Fuchs-Kliewer (FK) surface phonons. Calculated based dielectric theory reproduce measured very well. thickness well-ordered θ-Al2O3 layer is estimated be about 10 A.