Testing or inspecting apparatus and method for detecting differently shaped surfaces of objects

作者: Gunter H. Hatji

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摘要: In a testing or inspecting apparatus for the detection of objects, which have differently formed surfaces and are moved relative to apparatus, object (12) be tested is illuminated in plane at right angles main movement direction (arrow 14) with substantially an identical intensity over narrow zone extending width object. A device detecting reflected brightness and/or color values object, responding changes detected plane, supplies information signal, interpreted by computer (FIG. 1).

参考文章(3)
Hiroshi Makihira, Makoto Udaka, Toshimitsu Hamada, Yasuo Nakagawa, Surface defect inspection system ,(1980)
Smith E, Faulhaber M, Anthony J, Optical-electrical web inspection system ,(1973)