Dielectric spectroscopy of Pb0.92La0.08Zr0.52Ti0.48O3 films on hastelloy substrates with and without LaNiO3 buffer layers
作者： Manoj Narayanan , Beihai Ma , U. (Balu) Balachandran , Wei Li
DOI: 10.1063/1.3291127
关键词:
摘要: Pb0.92La0.08Zr0.52Ti0.48O3 (PLZT) films were deposited by sol-gel synthesis on Hastelloy substrates with and without a LaNiO3 buffer. The dielectric properties measured as function of temperature frequency to study the cause degradation in PLZT directly hastelloy substrates. These measurements indicated an increased charge carrier activity buffer layer. We propose that region film closer substrate surface is more oxygen deficient than bulk responsible for rather presence low parasitic secondary-phase interfacial layer such NiOx.
scitation.org
harvard.edu
osti.gov
aip.org
sci-hub.se 参考文章(18)
Cheol Seong Hwang, Byoung Taek Lee, Chang Seok Kang, Jin Won Kim, Ki Hoon Lee, Hag-Ju Cho, Hideki Horii, Wan Don Kim, Sang In Lee, Young Bum Roh, Moon Yong Lee, A COMPARATIVE STUDY ON THE ELECTRICAL CONDUCTION MECHANISMS OF (BA0.5SR0.5)TIO3 THIN FILMS ON PT AND IRO2 ELECTRODES Journal of Applied Physics. ,vol. 83, pp. 3703- 3713 ,(1998) , 10.1063/1.366595
K. Watanabe, A. J. Hartmann, R. N. Lamb, J. F. Scott, ELECTRONIC CHARACTERISTICS OF THE SRBI2TA2O9-PT JUNCTION Journal of Applied Physics. ,vol. 84, pp. 2170- 2175 ,(1998) , 10.1063/1.368279
N. Ortega, Ashok Kumar, R. S. Katiyar, J. F. Scott, Maxwell-Wagner space charge effects on the Pb(Zr,Ti)O3–CoFe2O4 multilayers Applied Physics Letters. ,vol. 91, pp. 102902- ,(2007) , 10.1063/1.2779853
Beihai Ma, Do-Kyun Kwon, Manoj Narayanan, U. (Balu) Balachandran, Dielectric properties of PLZT film-on-foil capacitors☆ Materials Letters. ,vol. 62, pp. 3573- 3575 ,(2008) , 10.1016/J.MATLET.2008.03.060
Taeyun Kim, Angus I. Kingon, Jon-Paul Maria, Robert T. Croswell, Lead zirconate titanate thin film capacitors on electroless nickel coated copper foils for embedded passive applications Thin Solid Films. ,vol. 515, pp. 7331- 7336 ,(2007) , 10.1016/J.TSF.2007.02.085
B. Nagaraj, S. Aggarwal, T. K. Song, T. Sawhney, R. Ramesh, Leakage current mechanisms in lead-based thin-film ferroelectric capacitors Physical Review B. ,vol. 59, pp. 16022- 16027 ,(1999) , 10.1103/PHYSREVB.59.16022
Q. Zou, H. E. Ruda, B. G. Yacobi, Improved dielectric properties of lead zirconate titanate thin films deposited on metal foils with LaNiO3 buffer layers Applied Physics Letters. ,vol. 78, pp. 1282- 1284 ,(2001) , 10.1063/1.1350425
S. Seifert, D. Sporn, T. Hauke, G. Müller, H. Beige, Dielectric and electromechanical properties of sol-gel prepared PZT thin films on metallic substrates Journal of The European Ceramic Society. ,vol. 24, pp. 2553- 2566 ,(2004) , 10.1016/J.JEURCERAMSOC.2003.08.007
H. N. Al-shareef, D. Dimos, W. L. Warren, B. A. Tuttle, A model for optical and electrical polarization fatigue in srbi2ta2o9 and Pb(Zr,Ti)o3 Integrated Ferroelectrics. ,vol. 15, pp. 53- 67 ,(1997) , 10.1080/10584589708015696
Jinrong Cheng, Liang He, Lingjuan Che, Zhongyan Meng, Lead zirconate titanate thin films prepared on metal substrates by the sol–gel methods Thin Solid Films. ,vol. 515, pp. 2398- 2402 ,(2006) , 10.1016/J.TSF.2006.05.001