作者: D. Nanda Gopala Krishna , R.P. George , John Philip
DOI: 10.1016/J.TSF.2019.04.044
关键词:
摘要: Abstract The phase compositions of nanoscale thick titania films on the titanium were determined using X-ray photoelectron spectroscopy valence band analysis for first time, by deconvoluting two-peak structure into five peaks and analyzing relative peak area. thickness varying from about 2 nm to 8 μm obtained air oxidation commercially pure at different temperatures. formed oxidizing temperatures up 200 °C amorphous, with